شناسایی مواد میکروویو پهن‌باند

This book is a practical engineering guide to microwave material measurements for both laboratory and manufacturing/field environments, including nondestructive inspection (NDI) and nondestructive evaluation (NDE). The book covers proven methods for characterizing materials at microwave frequencies, including both resonant and wide-bandwidth techniques, and gives you the necessary theory and equations for implementing these methods. You’ll understand how to invert dielectric and/or magnetic material properties from free space transmission and reflection, and how to measure traveling wave attenuation. You’ll also know how to measure dielectric and/or magnetic material properties from transmission line fixtures and learn how to use computational electromagnetic modeling with a measurement fixture. The book shows you how to build and use microwave NDE equipment for radomes and/or structural dielectric materials. This is an excellent resource for Engineers/scientists conducting or analyzing RF/Microwave/MMW material measurements for applications in electromagnetic materials, as well as those who are developing or applying microwave non-destructive evaluation (NDE) methods to their manufacturing problems. Wideband Microwave Materials Characterization Contents Preface 1 Introduction to Electromagnetic Materials Properties 1.1 Dielectric Properties 1.2 Magnetic Properties 1.3 Dispersion 1.4 Anisotropy 1.5 Engineered Materials References 2 Free-Space Methods 2.1 Historical Perspective 2.2 Calibration 2.2.1 One-Parameter Calibration 2.2.2 Four-Parameter Calibration 2.3 Time-Domain Processing 2.4 Inverting Intrinsic Properties 2.4.1 Microwave Network Analysis 2.4.2 Nicolson-Ross-Weir Algorithm 2.4.3 Iterative Algorithm: S11 or S21 2.4.4 Iterative Algorithm: S11 and S21 2.4.5 Iterative Algorithm: Shorted S11 2.4.6 Iterative Algorithm: Shorted S11 and S21 2.4.7 Iterative Algorithm: Four-Parameter 2.4.8 Inverting Sheet Impedance 2.5 Advanced Material Inversions 2.5.1 N-Layer Inversion 2.5.2 Two-Thickness Inversion 2.5.3 Model-Based Inversion 2.6 Absorber Characterization References 3 Microwave Nondestructive Evaluation 3.1 Sensors/Antennas 3.2 Dealing with RF Cables 3.3 Thickness Inversions 3.4 Thickness and Property Inversion 3.5 Defect Detection References 4 Focused-Beam Methods 4.1 Focused-Beam System Design 4.1.1 Gaussian Beam Basics 4.1.2 Lens Design 4.1.3 ABCD Matrix Design 4.1.4 Lens System Construction 4.2 Focused-Beam Measurement Examples 4.2.1 Dielectric Measurements 4.2.2 Magneto-Dielectric Measurements 4.3 Measurement Uncertainties 4.3.1 Transmission Line Errors 4.3.2 Focusing Error 4.3.3 Beam-Shift Error 4.3.4 Specimen Position 4.3.5 Other Errors: Network Analyzer and Specimen 4.4 Apertures References 5 Transmission Line Methods 5.1 Waveguides 5.1.1 Waveguide Calibration 5.1.2 Waveguide Property Inversion 5.1.3 Waveguide Air-Gap Correction 5.2 Coaxial Air Lines 5.2.1 Coaxial Calibration and Material Inversion 5.2.2 Air Gap Corrections in Coaxial Airlines 5.2.3 Wrapped-Coaxial Airline Method 5.2.4 Square Coaxial Airline 5.3 Stripline Methods 5.4 Other Transmission Line Methods References 6 Scatter and Surface Waves 6.1 Diffuse Scatter 6.1.1 RCS 6.1.2 Scattering Coefficient Measurement 6.1.3 Examples of Scattering-Coefficient Measurement 6.1.4 Echo-Width Measurement 6.1.5 Examples of Echo-Width Measurement 6.1.6 Cross-Polarized Scatter 6.2 Near-Field Probe Measurements 6.3 Surface-Traveling Wave 6.3.1 Surface-Wave Attenuation 6.3.2 Surface-Wave Attenuation Measurement 6.3.3 Surface-Wave Backscatter References 7 CEM-Based Methods 7.1 CEM 7.2 CEM Inversion of Broadband Materials 7.3 CEM Inversion Example: RF Capacitor 7.3.1 RF Capacitor Design 7.3.2 RF Capacitor Uncertainty 7.3.3 Example Measurements 7.4 CEM-Inversion Example: Nondestructive Measurement Probes 7.4.1 Epsilon Measurement Probe 7.4.2 Mu Measurement Probe 7.5 CEM Inversion Example: Slotted Rectangular Coaxial Line References 8 Impedance Analysis and Related Methods 8.1 Impedance Analysis 8.2 Dielectric Spectroscopy 8.2.1 Dielectric Parameters 8.2.2 Electrode Fixtures 8.2.3 Error Sources 8.3 Dielectric Spectroscopy Applications 8.3.1 Polymer Physics 8.3.2 Cure and Process Monitoring 8.3.3 Film Formation and Environmental Effects 8.3.4 High-Frequency Dielectric Analyses 8.4 Permeameter Methods References About the Author Index