Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß Für Röntgenoptik Und Mikroanalyse / Ve Congrès International Sur L’Optique Des Rayons X Et La Microanalyse : Tübingen, September 9th–14th, 1968

The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal­ lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H. Front Matter....Pages I-XII Present State of X-Ray Interferometry....Pages 1-10 X-Ray Reflection Optics (Recent Developments)....Pages 11-26 The Figuring of an Aspherical X-Ray Lens....Pages 27-32 Untersuchung zur ASR (Anomalous Surface Reflection) von Röntgenstrahlen mit einer Mikrofokus-Röntgenröhre....Pages 33-38 Grazing Incidence X-Ray Telescopes....Pages 39-44 Application of X-Ray Optical Methods in Solar Astronomy....Pages 45-49 Detection of Weak X-Ray Sources by Image Integration....Pages 50-54 Resolution Error Correction of Small Angle Scattering Data Using Hermite Functions....Pages 55-57 Principles and Limitations of Electron Probe Microanalysis....Pages 58-63 Recent Progress of Electron Microprobe in Japan....Pages 64-75 Measurements of Backscattered Electron Energy Spectra for Primary Beam Energies of 10 to 30 keV....Pages 76-79 Peak to Background Ratio in Microprobe Analysis....Pages 80-83 A Study of the Deadtime Correction in Electron Probe Microanalysis....Pages 84-92 The Measurement of Total Mass per Unit Area and Elemental Weight-Fractions along Line Scans in Thin Specimens....Pages 93-98 A Method for Composition Determination of Alloy Thin Films....Pages 99-103 An Experimental Method for Determining the Depth Distribution of Characteristic X-Rays in Electron Microprobe Specimens....Pages 104-113 Etat actuel des méthodes quantitatives d’analyse par sonde électronique....Pages 114-131 Présentation d’un programme de calcul sur ordinateur des diverses corrections à appliquer aux analyses à la microsonde électronique....Pages 132-134 Programme de calcul de l‹intensité des rayons X émis en microanalyse à sonde électronique et analyse quantitative....Pages 135-140 Formulae for Absorption Correction with Regard to Indirect Excitation of K , L and M Lines....Pages 141-145 Accuracy of Atomic Number and Absorption Corrections in Electron Probe Microanalysis....Pages 146-150 Propagation of Errors in Correction Models for Quantitative Electron Probe Microanalysis....Pages 151-159 Prüfung der Korrekturen für Ordnungszahl, Absorption und sekundäre Fluoreszenz an metallischen Zweistofflegierungen mit nur je einem Matrixeffekt....Pages 160-165 Eine empirische Methode zur quantitativen chemischen Analyse von Mikroteilchen mit der Mikrosonde....Pages 166-169 The Magnitude of the “Continuous” Fluorescence Correction in Electronprobe Analysis....Pages 170-174 An Attempt for Quantitative Procedure....Pages 175-179 Analyse quantitative d’echantillons minces....Pages 180-186 Phenomenes de fluorescence aux limites de phases....Pages 187-192 Die Massenschwächungskoeffizienten der Kohlenstoff- K α -Linie in Abhängigkeit von der Ordnungszahl....Pages 193-197 Messung des Massenabsorptionskoeffizienten in Kohlenstoff im Wellenbereich 10 bis 70 Å....Pages 198-205 Recent Advances in Instrumentation for Microprobe Analysis....Pages 206-218 A Precision Linear X-Ray Spectrometer....Pages 219-223 Iron-Free Lenses for Electron Probe Forming Systems....Pages 224-230 Elektronische Techniken für die Elektronenstrahl-Mikroanalyse....Pages 231-234 Elektronenstrahl-Mikroanalyse mit der Elmisonde: Arbeitstechnik und Analysemöglichkeiten....Pages 235-240 A Microanalysis Attachment for the Elmiskop I....Pages 241-244 Performance Analysis of a Combined Electron Microscope and Electron Probe Microanalyser “EMMA”....Pages 245-247 A Shielded X-Ray Microprobe for the Analysis of Radioactive Samples....Pages 248-249 Analysis of Radioactive Materials by Means of an Electron Microprobe Demonstrated on UO 2 —Mo and UO 2 -Zircalloy Fuel Cermets....Pages 250-260 The TPD Electron Probe X-Ray Micro Analyzer....Pages 261-268 New Spectrometers and Accessories for the Electron Microprobe....Pages 269-273 Geräte und Methoden zur quantitativen Gefügecharakterisierung mit der Mikrosonde....Pages 274-277 Der Vielkanalanalysator als Zusatzgerät zur Mikrosonde für die Spurenanalyse und die Analyse mit geringen Strömen....Pages 278-281 Développement d’accessoires adaptables au microanalyseur à sonde électronique pour l’étude des inclusions....Pages 282-286 Sélecteur de fréquences X pour le rayonnement synchrotron. Etude de la réflexion spéculaire entre 6 et 14Å....Pages 287-292 Microanalysis in the Transmission Electron Microscope by Selected Area Electron Spectrometry....Pages 293-298 Microanalysis by Electron Energy Analysis with a Cylindrical Magnetic Lens....Pages 299-304 Effect of Electron Source to Energy Resolution in Electron Velocity Analysis — Interpretation of Boersch Effect....Pages 305-310 Microanalyseur par émission ionique secondaire....Pages 311-318 Microanalysis with a Proton-Probe....Pages 319-324 Microanalyse d’une surface solide par iono-luminescence....Pages 325-328 A High Resolution Electron Microscope for Conventional Imaging and Scanning Mode of Operation....Pages 329-332 Development of a Scanning Electron Mirror Microscope....Pages 333-336 Computer Controlled Scanning Electron Microscope....Pages 337-340 A New Scanning Electron Microscope....Pages 341-342 A Combined Scanning Electron Microscope/Electron Microprobe Analyzer....Pages 343-344 Photo Emission Electron Microscopy....Pages 345-350 Röntgenemissionsspektrometrie von Elementen niedriger Ordnungszahl ( Z < 15)....Pages 351-360 The Detection of Light Elements....Pages 361-364 Quantitative Analysis of Oxygen in Electron Probe Microanalysis....Pages 365-368 Beryllium Determination in Electron Probe Microanalysis....Pages 369-372 Microanalyse des éléments très légers....Pages 375-380 Utilisation des compteurs à flux gazeux dans le domaine des rayons X ultra-mous pour l’étude des sources à émissions brèves....Pages 381-382 The Accuracy of the Orientation of Cubic Crystals from Back Reflection Kossel Patterns....Pages 383-387 Technique for Orientation Determinations by Means of Kossel Diffraction in the Electron Microprobe....Pages 388-395 A Method for the Precise Determination of Lattice Spacings from Kossel Patterns from Selected Grains in Steel Samples....Pages 396-400 A Variable Orientation Specimen Holder for Precision Microdiffraction in the Reflection Mode....Pages 401-405 Hochtemperatur-Kossel-Technik....Pages 406-411 Nouvelle méthode d’obtention des diagrammes de diffraction en rayonnement X divergent....Pages 412-414 Metallurgical and Mineralogical Applications....Pages 415-423 Mineralogical Applications of the Electron Probe Microanalyser....Pages 424-431 Standards and Correction Procedures in Electron-Probe Analysis of Rock-Forming Minerals....Pages 432-437 Specimen Damage during Microprobe Analysis of Silicate Glasses....Pages 438-442 Investigation of Ni-Zn Ferrite Formation by Electron Probe Microanalyser....Pages 443-446 An Electron Microprobe Analysis of Cu 2−x Layers Chemiplated on Single Crystals and Thin Films of CdS....Pages 447-457 Application of X-Ray Microanalyser to Cast Iron “Relation between Few Elements of Nodular Graphite Cast Iron and Nodular Graphite”....Pages 458-461 Absorberstrommessungen an Mehrphasensystemen....Pages 462-466 Die Anwendung der Mikrosonde bei der Aufstellung von Mehrstoffsystemen....Pages 467-473 Trace Elements in Ferro-Alloy Deoxidants and Their Influence on Non-Metallic Inclusion Compositions....Pages 474-480 Untersuchungen an supraleitenden Diffusionsschichten mit einer Elektronenstrahlmikrosonde....Pages 481-484 Untersuchung von Diffusionsvorgängen an Mehrstoff-Gleitlagern mit der Elektronenstrahl-Mikrosonde....Pages 485-494 The Influence of Surface Treatment on the Diffusivity in the Surface Layers of Stainless Steels....Pages 495-498 Investigation of Hard Magnetic Materials by Small Angle Diffraction of Neutrons....Pages 499-501 Mesure d’homogénéité des mélanges de poudres par micro-analyse a sonde électronique....Pages 502-508 Analyse des précipités extraits sur repliques, à l’aide d’un microanalyseur classique et d’un microanalyseur équipé d’un microscope électronique....Pages 509-518 Diffusion chimique Zinc—Nickel. Coefficients de diffusion intrinsèques....Pages 519-530 Electron Probe Microanalysis of Ti(C, N) and Zr(C, N) in Steel....Pages 531-534 Bestimmung der Grenzflächenenergie zwischen Zementit-Partikeln und Ferrit-Matrix mit Hilfe der Ostwald-Reifung....Pages 535-539 Die Röntgenröhrenspannung als Einflußgröße bei der quantitativen RFA....Pages 540-542 Messungen der Dichte dünner Aufdampfschichten....Pages 543-545 Biological Work Using Microfluorescence Analysis....Pages 546-549 Biological Applications of Projection X-Ray Microscopy....Pages 550-560 Comparison between X-Ray Fluorescence and Ultra-Micro Flame Photometric Analyses of the Electrolyte Content in Single Cells....Pages 561-568 X-Ray Histochemistry Used for Simultaneous Demonstration of Neurones and Capillaries in the Human Brain....Pages 569-578 Histochimie par spectrographie des RX....Pages 579-581 The Application of Microprobe Analysis to Biology....Pages 582-591 Electron Microprobe Studies on the Mineralization Process of Tooth and Bone....Pages 592-596 Electron Probe Microanalysis of Filled Human Teeth....Pages 597-600 Zerstörungsfreie Analyse von Zahnhartsubstanzen mit der Elektronenstrahlmikrosonde....Pages 601-607 The Correlation of Bone Mineral with Body Build and Bone Turnover....Pages 608-610 The Correlation between Microradiography and Scanning Electron Microscopy of Bone Section Surfaces....Pages 611-612 The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V.E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metalƯ lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K.H