VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))
معرفی کتاب «VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover))» نوشتهٔ Rohit Kapur، Nur A. Touba، Shianling Wu، Duncan M. (Hank) Walker، Erik H. Volkerink، Charles Stroud، Janusz Rajski، Mehrdad Nourani، Benoit Nadeau-Dostie، Yinghua Min، T.M. Mak، Xiaowei Li، James C.-M. Li، Kuen-Jong Lee، Brion Keller، Mike Peng Li، Wen-Ben Jone، Shi-Yu Huang، Jiun-Lang Huang، Michael S. Hsiao، William Eklow، Kwang-Ting (Tim) Cheng، Xinghao Chen، Soumendu Bhattacharya، Khader S. Abdel-Hafez، Xiaoqing Wen، Cheng-Wen Wu، Laung-Terng Wang و Abhijit Chatterjee، منتشرشده توسط نشر Elsevier Morgan Kaufmann Publishers; Morgan Kaufmann در سال 2006. این کتاب در فرمت pdf، زبان انگلیسی ارائه شده است.
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. ?· Most up-to-date coverage of design for testability. ?· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. ?· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.?· Lecture slides and exercise solutions for all chapters are now available.?· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website. This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. · Lecture slides and exercise solutions for all chapters are now available. · Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.