وبلاگ بلیان

Synthesis, crystal growth, and characterization : proceedings of the International School on Synthesis, Crystal Growth, and Characterization of Materials for Energy Conversion and Storage, October 12-23, (1981), National Physical Laboratory, New Delhi

معرفی کتاب «Synthesis, crystal growth, and characterization : proceedings of the International School on Synthesis, Crystal Growth, and Characterization of Materials for Energy Conversion and Storage, October 12-23, (1981), National Physical Laboratory, New Delhi» نوشتهٔ Krishan Lal; National Physical Laboratory; International School on Synthesis, Crystal Growth, and Characterization of Materials for Energy Conversion and Storage، منتشرشده توسط نشر North Holland در سال 1982. این کتاب در فرمت pdf، زبان انگلیسی ارائه شده است.

Synthesis, Crystal Growth and Characterization presents the proceedings of the International School on Synthesis, Crystal Growth and Characterization of Materials for Energy Conversion and Storage, held on October 12-23, 1981, at the National Physical Laboratory in New Delhi, India. The book consists of lectures by distinguished scientists from around the world who tackle different aspects of synthesis, crystal growth, characterization of materials, energy conversion, and energy storage. Organized into four parts encompassing 26 chapters, the book begins with an overview of the synthesis of materials at high temperatures and pressures before turning to a discussion of how macrocrystalline and amorphous silicon is prepared. It then looks at fundamental principles underlying the process of crystal growth, both from the vapor phase and from melt, and methodically introduces the reader to the different techniques used to characterize materials, including neutron scattering and electron transport. The next chapters focus on point defects and aggregates that influence the critical electronic properties of semiconducting materials, X-ray diffraction studies of strains and stresses in thin films used in solid-state devices, and electron spectroscopic studies of solid surfaces. The book also considers the role of physics in microelectronics and vice versa, fast ion transport in solids, and the concept of Syadvada in relation to modern physics. This volume is a valuable resource for participants of the International School on Synthesis, Crystal Growth and Characterization of Materials for Energy Conversion and Storage, as well as active researchers working in areas related to the field. Content: FRONT MATTER , Page i Copyright , Page ii DR. AJIT RAM VERMA , Pages iii-iv SPONSORING ORGANISATIONS , Pages v-vi FOREWORD , Pages ix-x , Emmanuel Kaldis PREFACE , Pages xi-xii , Krishan Lal CRYSTAL GROWTH AND LATTICE IMPERFECTIONS–INTERFEROMETRIC AND X-RAY DIFFRACTION STUDIES: REMINISCENCES , Pages 1-56 , AJIT RAM VERMA HIGH-TEMPERATURE CRYSTAL GROWTH AND THERMODYNAMIC CHARACTERIZATION OF MATERIALS WITH VALENCE INSTABILITIES , Pages 57-85 , E. KALDIS, B. FRITZLER, H. SPYCHIGER, B. STEINMANN MICROCRYSTALLINE AND AMORPHOUS SILICON PREPARED BY LOW PRESSURE PLASMA CVD , Pages 87-92 , Z. IQBAL CRYSTALLIZATION OF ELECTRONIC MATERIALS UNDER VERY HIGH GAS PRESSURES , Pages 93-117 , SŁAWOMIR MAJOROWSKI FUNDAMENTAL ASPECTS OF CRYSTAL GROWTH AND EPITAXY (in-situ STUDIES) , Pages 119-134 , R. KERN FUNDAMENTAL ASPECTS AND TECHNIQUES OF CRYSTAL GROWTH FROM THE MELT , Pages 135-183 , CARLO PAORICI HIGH-TEMPERATURE NON-METALLIC CRYSTALLINE MATERIALS , Pages 185-195 , V.V. OSIKO CRYSTAL GROWTH AND EPITAXY FROM HIGH-TEMPERATURE SOLUTIONS , Pages 197-211 , W. TOLKSDORF CHARACTERISATION OF CRYSTAL PERFECTION BY DIFFRACTION METHODS , Pages 213-214 , NORIO KATO AN INTRODUCTION TO THE EXPERIMENTAL TECHNIQUES USED IN X-RAY DIFFRACTION TOPOGRAPHY , Pages 215-241 , KRISHAN LAL X-RAY DIFFRACTION MEASUREMENT OF STRAINS AND STRESSES IN THIN FILMS , Pages 243-259 , ARMIN SEGMÜLLER X-RAY DIFFRACTION STUDY OF PERIODIC AND RANDOM FAULTING IN CLOSE-PACKED STRUCTURES , Pages 261-285 , DHANANJAI PANDEY, P. KRISHNA CHARACTERIZATION OF POINT DEFECT AGGREGATES IN NEARLY PERFECT CRYSTALS BY DIFFUSE X-RAY SCATTERING MEASUREMENTS , Pages 287-315 , KRISHAN LAL ELECTRON SPECTROSCOPIC STUDIES OF SOLID SURFACES , Pages 317-338 , C.N.R. RAO DEFECT CHARACTERIZATION USING TRANSMISSION AND SCANNING ELECTRON MICROSCOPY , Pages 339-371 , J. HEYDENREICH THE STRUCTURE OF GRAIN BOUNDARIES , Pages 373-388 , S. RANGANATHAN STRUCTURE OF TIN OXIDE FILMS , Pages 389-397 , S.K. PENEVA, D.D. NIHTIANOVA, R.K. RUDARSKA, K.D. DJUNEVA, I.Z. KOSTADINOV CHARACTERISATION OF MATERIALS BY NEUTRON SCATTERING , Pages 399-412 , R. CHIDAMBARAM, A. SEQUEIRA CHARACTERISATION OF SEMICONDUCTORS BY ELECTRON TRANSPORT EXPERIMENTS , Pages 413-426 , B.R. NAG STRUCTURAL CHANGES IN CRYSTALS AT POWER DENSITIES NEAR THE ELECTRIC BREAKDOWN , Pages 427-438 , PETER THOMA, KRISHAN LAL PHYSICS IN MICROELECTRONICS AND MICROELECTRONICS IN PHYSICS , Pages 439-467 , E. MOOSER SOLAR CELLS , Pages 469-484 , JOHN B. GOODENOUGH SOLAR GENERATORS WITH CRYSTALLINE SILICON SOLAR CELLS , Pages 485-496 , KURT ROY IONIC CONDUCTORS: THE STRUCTURAL APPROACH , Pages 497-518 , HEINZ SCHULZ FAST ION TRANSPORT IN SOLIDS , Pages 519-553 , JOHN B. GOODENOUGH MODERN PHYSICS AND SYĀDVĀDA , Pages 555-568 , D.S. KOTHARI
دانلود کتاب Synthesis, crystal growth, and characterization : proceedings of the International School on Synthesis, Crystal Growth, and Characterization of Materials for Energy Conversion and Storage, October 12-23, (1981), National Physical Laboratory, New Delhi