Smart Card Research and Advanced Applications : 17th International Conference, CARDIS 2018, Montpellier, France, November 12–14, 2018, Revised Selected Papers

This book constitutes the thoroughly refereed post-conference proceedings of the 17th International Conference on Smart Card Research and Advanced Applications, CARDIS 2018, held in Monpellier, France, in November 2018. The 13 revised full papers presented in this book were carefully reviewed and selected from 28 submissions. CARDIS has provided a space for security experts from industry and academia to exchange on security of smart cards and related applications. Front Matter ....Pages I-X Convolutional Neural Network Based Side-Channel Attacks in Time-Frequency Representations (Guang Yang, Huizhong Li, Jingdian Ming, Yongbin Zhou)....Pages 1-17 A Systematic Study of the Impact of Graphical Models on Inference-Based Attacks on AES (Joey Green, Arnab Roy, Elisabeth Oswald)....Pages 18-34 Improving Side-Channel Analysis Through Semi-supervised Learning (Stjepan Picek, Annelie Heuser, Alan Jovic, Karlo Knezevic, Tania Richmond)....Pages 35-50 Non-profiled Mask Recovery: The Impact of Independent Component Analysis (Si Gao, Elisabeth Oswald, Hua Chen, Wei Xi)....Pages 51-64 How (Not) to Use Welch’s T-Test in Side-Channel Security Evaluations (François-Xavier Standaert)....Pages 65-79 Scalable Key Rank Estimation (and Key Enumeration) Algorithm for Large Keys (Vincent Grosso)....Pages 80-94 Shorter Messages and Faster Post-Quantum Encryption with Round5 on Cortex M (Markku-Juhani O. Saarinen, Sauvik Bhattacharya, Oscar Garcia-Morchon, Ronald Rietman, Ludo Tolhuizen, Zhenfei Zhang)....Pages 95-110 Yet Another Size Record for AES: A First-Order SCA Secure AES S-Box Based on \(\mathrm {GF}(2^8)\) Multiplication (Felix Wegener, Amir Moradi)....Pages 111-124 Jitter Estimation with High Accuracy for Oscillator-Based TRNGs (Shaofeng Zhu, Hua Chen, Limin Fan, Meihui Chen, Wei Xi, Dengguo Feng)....Pages 125-139 Electromagnetic Activity vs. Logical Activity: Near Field Scans for Reverse Engineering (Marc Lacruche, Philippe Maurine)....Pages 140-155 An In-Depth and Black-Box Characterization of the Effects of Laser Pulses on ATmega328P (Dilip S. V. Kumar, Arthur Beckers, Josep Balasch, Benedikt Gierlichs, Ingrid Verbauwhede)....Pages 156-170 Breaking All the Things—A Systematic Survey of Firmware Extraction Techniques for IoT Devices (Sebastian Vasile, David Oswald, Tom Chothia)....Pages 171-185 Exploiting JCVM on Smart Cards Using Forged References in the API Calls (Sergei Volokitin)....Pages 186-199 Back Matter ....Pages 201-201