Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences, 5)

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. Levers And Noise -- Mechanical Properties Of Levers -- Stress And Strain -- Moments -- Spring Constant -- The Rayleigh Solution To A Vibrating Lever -- The Classical Solution To A Vibrating Lever -- Normal Modes -- Lumped Systems -- Resonance Enhancement -- Bimorph Driver -- Effective Spring Constant -- Bimorph-driven Lever -- Sample-driven Lever -- Tip-driven Lever -- Sources Of Noise -- Shot Noise -- Resistor Johnson Noise -- Laser Intensity Noise -- Laser Phase Noise -- Thermally Induced Lever Noise -- Bimorph Noise -- Lever Noise-limited Snr -- Experimental Characterization Of Noise -- Scanning Force Microscopes -- Tunneling Detection System -- Perpendicular Arrangement -- Cross Arrangement -- Parallel Arrangement -- Serial Arrangement -- Single-lever Arrangement -- Capacitance Detection System -- Homodyne Detection System -- Heterodyne Detection System -- Laser-diode Feedback Detection System -- Polarization Detection System -- Deflection Detection System -- Scanning Force Microscopy -- Electric Force Microscopy -- Magnetic Force Microscopy -- Principles Of Operation -- Noise Considerations -- Applications -- Performance -- Atomic Force Microscopy -- Intermolecular Microscopic Interactions -- Intermolecular Macroscopic Interactions -- Lever-tip-sample Contact Interactions -- Lever-tip-sample Noncontact Interactions -- Experimental Results For The Contact Mode. Dror Sarid. Includes Bibliographical References And Index. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed.