Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences, 5)

Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field. PREFACE TO THE REVISED EDITION......Page 8 PREFACE......Page 10 Contents......Page 16 1.1. Introduction......Page 22 1.2. Stress and Strain......Page 23 1.3. Moments......Page 25 1.4. Spring Constant......Page 26 1.5. The Rayleigh Solution to a Vibrating Lever......Page 28 1.6. The Classical Solution to a Vibrating Lever......Page 30 1.7. Normal Modes......Page 31 1.8. Lumped Systems......Page 33 1.9. Examples......Page 34 1.10. Summary......Page 38 2.2. Bimorph Driver......Page 40 2.3. Effective Spring Constant......Page 42 2.4. Bimorph-Driven Lever......Page 43 2.5. Sample-Driven Lever......Page 53 2.6. Tip-Driven Lever......Page 56 2.7. Summary......Page 58 3.2. General Discussion of Noise......Page 60 3.3. Shot Noise......Page 62 3.5. Laser Intensity Noise......Page 63 3.6. Laser Phase Noise......Page 64 3.7. Thermally Induced Lever Noise......Page 67 3.9. Lever Noise-Limited SNR......Page 70 3.10. Experimental Characterization of Noise......Page 71 3.11. Summary......Page 74 4.2. Theory......Page 76 4.3. Perpendicular Arrangement......Page 78 4.8. Summary......Page 85 5.1. Introduction......Page 86 5.2. Theory......Page 87 5.3. Noise Considerations......Page 89 5.4. Performance of Systems......Page 90 5.5. Summary......Page 94 6.1. Introduction......Page 96 6.2. Theory......Page 97 6.3. Noise Considerations......Page 102 6.4. System Performance......Page 105 6.5. Summary......Page 110 7.1. Introduction......Page 112 7.2. Theory......Page 113 7.3. Noise Considerations......Page 116 7.4. Performance......Page 117 7.5. Summary......Page 120 8.1. Introduction......Page 122 8.2. Theory......Page 123 8.3. Noise Considerations......Page 126 8.4. Performance......Page 128 8.5. Summary......Page 129 9.2. Theory......Page 130 9.3. Noise Considerations......Page 134 9.4. Performance......Page 137 9.5. Summary......Page 138 10.1. Introduction......Page 140 10.2. Theory......Page 141 10.3. Noise Considerations......Page 143 10.4. Performance......Page 146 10.5. Summary......Page 149 11.2. Basic Concepts......Page 150 11.3. Examples......Page 152 11.4. Principles of Operation......Page 158 11.5. Noise Considerations......Page 166 11.6. Applications......Page 167 11.7. Performance......Page 169 11.8. Summary......Page 172 12.2. Basic Concepts......Page 174 12.3. Examples......Page 177 12.4. Principles of Operation......Page 188 12.5. Noise Considerations......Page 194 12.7. Performance......Page 195 12.8. Summary......Page 201 13.1. Introduction......Page 202 13.2. Intermolecular Microscopic Interactions......Page 203 13.3. Intermolecular Macroscopic Interactions......Page 210 13.4. Lever-Tip-Sample Contact Interactions......Page 218 13.5. Lever-Tip-Sample Noncontact Interactions......Page 231 13.6. Experimental Results for the Contact Mode......Page 239 References......Page 254 L......Page 282 S......Page 283 Y......Page 284 Levers And Noise -- Mechanical Properties Of Levers -- Stress And Strain -- Moments -- Spring Constant -- The Rayleigh Solution To A Vibrating Lever -- The Classical Solution To A Vibrating Lever -- Normal Modes -- Lumped Systems -- Resonance Enhancement -- Bimorph Driver -- Effective Spring Constant -- Bimorph-driven Lever -- Sample-driven Lever -- Tip-driven Lever -- Sources Of Noise -- Shot Noise -- Resistor Johnson Noise -- Laser Intensity Noise -- Laser Phase Noise -- Thermally Induced Lever Noise -- Bimorph Noise -- Lever Noise-limited Snr -- Experimental Characterization Of Noise -- Scanning Force Microscopes -- Tunneling Detection System -- Perpendicular Arrangement -- Cross Arrangement -- Parallel Arrangement -- Serial Arrangement -- Single-lever Arrangement -- Capacitance Detection System -- Homodyne Detection System -- Heterodyne Detection System -- Laser-diode Feedback Detection System -- Polarization Detection System -- Deflection Detection System -- Scanning Force Microscopy -- Electric Force Microscopy -- Magnetic Force Microscopy -- Principles Of Operation -- Noise Considerations -- Applications -- Performance -- Atomic Force Microscopy -- Intermolecular Microscopic Interactions -- Intermolecular Macroscopic Interactions -- Lever-tip-sample Contact Interactions -- Lever-tip-sample Noncontact Interactions -- Experimental Results For The Contact Mode. Dror Sarid. Includes Bibliographical References And Index. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed.