Reliability Characterisation of Electrical and Electronic Systems (Woodhead Publishing Series in Electronic and Optical Materials)

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices. The text describes the reliability behavior of electrical and electronic systems. It takes an empirical scientific approach to reliability engineering to facilitate a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation. After introducing the fundamentals and background to reliability theory, the text moves on to describe the methods of reliability analysis and charactersation across a wide range of applications. Takes a holistic approach to reliability engineering Looks at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability Facilitates a greater understanding of operating conditions, failure mechanisms and the need for testing for a more realistic characterisation Content: Front Matter, Pages i-iii Copyright, Page iv List of contributors, Pages ix-x, N. Aitken, B.M. Al-Hashimi, R.W.A. Barnard, T.-M.I. Băjenescu, M.I. Bâzu, A. Das, E. George, P.D. Goodman, C. Hendricks, J.-S. Huang, D. Medhat, G. Merrett, A.S. Oates, M. Osterman, M. Pecht, K.L. Pey, N. Raghavan, F. Schenkelberg, R.A. Shafik, R. Skipper, J. Swingler, et al. Woodhead Publishing Series in Electronic and Optical Materials, Pages xi-xiv Foreword, Page xv, Marc Desmulliez 1 - Introduction, Pages 1-10 2 - Reliability and stupidity: mistakes in reliability engineering and how to avoid them, Pages 11-25, R.W.A. Barnard 3 - Physics-of-failure (PoF) methodology for electronic reliability, Pages 27-42, C. Hendricks, E. George, M. Osterman, M. Pecht 4 - Modern instruments for characterizing degradation in electrical and electronic equipment, Pages 43-62, P.D. Goodman, R. Skipper, N. Aitken 5 - Reliability building of discrete electronic components, Pages 63-82, T.-M.I. Băjenescu, M.I. Bâzu 6 - Reliability of optoelectronics, Pages 83-114, J.-S. Huang 7 - Reliability of silicon integrated circuits, Pages 115-141, A.S. Oates 8 - Reliability of emerging nanodevices, Pages 143-168, N. Raghavan, K.L. Pey 9 - Design considerations for reliable embedded systems, Pages 169-194, R.A. Shafik, A. Das, S. Yang, G. Merrett, B.M. Al-Hashimi 10 - Reliability approaches for automotive electronic systems, Pages 195-213, D. Medhat 11 - Reliability modeling and accelerated life testing for solar power generation systems, Pages 215-250, F. Schenkelberg Index, Pages 251-257

This book takes a holistic approach to reliability engineering for electrical and electronic systems by looking at the failure mechanisms, testing methods, failure analysis, characterisation techniques and prediction models that can be used to increase reliability for a range of devices.