Principles Of Analytical Electron Microscopy Softcover Reprint Of The Original 1st Ed. 1986

Since the publication in 1979 of Introduction to Analytical Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C. Joy; Plenum Press), analytical electron microscopy has continued to evolve and mature both as a topic for fundamental scientific investigation and as a tool for inorganic and organic materials characterization. Significant strides have been made in our understanding of image formation, electron diffraction, and beam/specimen interactions, both in terms of the "physics of the processes" and their practical implementation in modern instruments. It is the intent of the editors and authors of the current text, Principles of Analytical Electron Microscopy, to bring together, in one concise and readily accessible volume, these recent advances in the subject. The text begins with a thorough discussion of fundamentals to lay a foundation for today's state-of-the-art microscopy. All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention. To increase the utility of the volume to a broader cross section of the scientific community, the book's approach is, in general, more descriptive than mathematical. In some areas, however, mathematical concepts are dealt with in depth, increasing the appeal to those seeking a more rigorous treatment of the subject. Front Matter....Pages i-xvi Electron Beam-Specimen Interactions in the Analytical Electron Microscope....Pages 1-27 Introductory Electron Optics....Pages 29-76 Principles of Image Formation....Pages 77-122 Principles of X-Ray Energy-Dispersive Spectrometry in the Analytical Electron Microscope....Pages 123-153 Quantitative X-Ray Analysis....Pages 155-217 EDS Quantitation and Application to Biology....Pages 219-248 The Basic Principles of Eels....Pages 249-276 Quantitative Microanalysis Using EELS....Pages 277-299 Electron Microdiffraction....Pages 301-352 Barriers to AEM: Contamination and Etching....Pages 353-374 Radiation Effects Encountered by Inorganic Materials in Analytical Electron Microscopy....Pages 375-392 High-Resolution Microanalysis and Energy-Filtered Imaging in Biology....Pages 393-411 A Critique of the Continuum Normalization Method used for Biological X-Ray Microanalysis....Pages 413-443 Back Matter....Pages 445-448