Основы анализа поверхности и тонких пленок

This book focuses on the physics underlying techniques used to analyze the surface region of materials. It is a book written for the materials scientist interested in the use of electron spectroscopies or ion beam analysis for sample characterization, for the materials analyst who needs information on techniques that are available outside the laboratory, and particularly for students who will use this new generation of analytical techniques in their research. Leonard C. Feldman, James W. Mayer. Includes Bibliographies And Index.