Optical Characterization of Semiconductors: Infrared, Raman, and Photoluminescence Spectroscopy (Volume 14) (Techniques of Physics, Volume 14)

Today's complex and varied semiconductor microstructures are difficult to characterize for devices, or to provide feedback to materials makers for better materials. Optical methods are one of the best means of characterization; they require no contacts and do not damage samples, they measure a variety of properties, and they work for bulk or layered structures made of elemental, binary, or ternary semiconductors. There are several useful optical approaches which operate at different wavelengths. In the past this meant it was difficult to find the best method for a given characterization need. Now, it is possible to learn techniques and select approaches from Optical Characterization of Semiconductors, the first book to explain, illustrate, and compare the most widely used methods: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book assumes no special knowledge of semiconductors or optics, but develops the background needed to understand the why and how of each technique. Each method is illustrated with dozens of case studies taken from current literature, which address specific problems in silicon, GaAs, Al[subscript x]Ga[subscript 1-x]As, and other widely-used materials. This library of uses, arranged by property evaluated (such as impurity type, resistivity, and layer thickness) is valuable even for those familiar with optical methods. Practical information is given to help establish optical facilities, including commercial sources for equipment, and experimental details which draw on the author's wide experience. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods for characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics or photonics, the book provides a unique overview, bringing together these valuable techniques in a coherent way for the first time. Read more... This is the first book to explain, illustrate, and compare the most widely used methods in optics: photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time.

Discusses and compares infrared, Raman, and photoluminescence methods
Enables readers to choose the best method for a given problem
Illustrates applications to help non-experts and industrial users, with answers to selected common problems
Presents fundamentals with examples from the semiconductor literature without excessive abstract discussion
Features equipment lists and discussion of techniques to help establish characterization laboratories This is the first book to explain, illustrate, and compare the most widely used methods in photoluminescence, infrared spectroscopy, and Raman scattering. Written with non-experts in mind, the book develops the background needed to understand the why and how of each technique, but does not require special knowledge of semiconductors or optics. Each method is illustrated with numerous case studies. Practical information drawn from the authors experience is given to help establish optical facilities, including commercial sources for equipment, and experimental details. For industrial scientists with specific problems in semiconducting materials; for academic scientists who wish to apply their spectroscopic methods to characterization problems; and for students in solid state physics, materials science and engineering, and semiconductor electronics and photonics, this book provides a unique overview, bringing together these valuable techniques in a coherent wayfor the first time. Discusses and compares infrared, Raman, and photoluminescence methodsEnables readers to choose the best method for a given problemIllustrates applications to help non-experts and industrial users, with answers to selected common problemsPresents fundamentals with examples from the semiconductor literature without excessive abstract discussionFeatures equipment lists and discussion of techniques to help establish characterization laboratories Content: Techniques of Physics , Page ii Front Matter , Page iii Copyright , Page iv Dedication , Page v Preface , Pages ix-x 1 - Introduction , Pages 1-6 2 - Optical Theory for Semiconductor Characterization , Pages 7-16 3 - Optical Physics of Semiconductors , Pages 17-44 4 - Measurement Methods , Pages 45-59 5 - Case Studies: Photoluminescence Characterization , Pages 61-103 6 - Case Studies: Raman Characterization , Pages 105-158 7 - Case Studies: Infrared Characterization , Pages 159-200 8 - Summary and Future Trends , Pages 201-205 References , Pages 207-215 INDEX , Pages 217-220 This book discusses and compares infrared, Raman and photoluminescence optical methods for non-destructive chararacterization of semiconductor materials, structures and devices. Applications are illustrated through case studies in silicon, GaAs and other materials.