Magnetic Resonance of Semiconductors and Their Nanostructures: Basic and Advanced Applications (Springer Series in Materials Science (253))

This book explains different magnetic resonance (MR) techniques and uses different combinations of these techniques to analyze defects in semiconductors and nanostructures. It also introduces novelties such as single defects MR and electron-paramagnetic-resonance-based methods: electron spin echo, electrically detected magnetic resonance, optically detected magnetic resonance and electron-nuclear double resonance – the designated tools for investigating the structural and spin properties of condensed systems, living matter, nanostructures and nanobiotechnology objects. Further, the authors address problems existing in semiconductor and nanotechnology sciences that can be resolved using MR, and discuss past, current and future applications of MR, with a focus on advances in MR methods. The book is intended for researchers in MR studies of semiconductors and nanostructures wanting a comprehensive review of what has been done in their own and related fields of study, as well as future perspectives. Front Matter....Pages i-xv Basic Concepts of Electron Paramagnetic Resonance....Pages 1-111 Fundamentals of EPR Related Methods....Pages 113-178 Retrospectives: Magnetic Resonance Studies of Intrinsic Defects in Semiconductors....Pages 179-211 State-of-Art: High-Frequency EPR, ESE, ENDOR and ODMR in Wide-Band-Gap Semiconductors....Pages 213-355 Magnetic Resonance in Semiconductor Micro- and Nanostructures....Pages 357-433 Perspectives of Applications of Magnetic Properties of Semiconductor Nanostructures and Single Defects....Pages 435-518 Back Matter....Pages 519-524 Presenting for the first time novelties such as single defects MR as well as state-of-the-art HF pulse methods such as EPR and ENDOR, this volume focuses on a range of magnetic resonance methods and their applications in solids such as semiconductors