Fundamentals of Energy Dispersive X-Ray Analysis : Butterworths Monographs in Materials

Fundamentals of Energy Dispersive X-ray Analysis provides an introduction to the fundamental principles of dispersive X-ray analysis. It presents descriptions, equations, and graphs to enable the users of these techniques to develop an intuitive and conceptual image of the physical processes involved in the generation and detection of X-rays. The book begins with a discussion of X-ray detection and measurement, which is accomplished by one of two types of X-ray spectrometer: energy dispersive or wavelength dispersive. The emphasis is on energy dispersive spectrometers, given their rather widespread use compared to the wavelength dispersive type. This is followed by separate chapters on techniques such as X-ray absorption; spectrum processing; and elimination of spectrum background produced by electron excitation. Subsequent chapters cover X-ray fluorescence; the use of regression models; hardware for X-ray fluorescence analysis; scattering, background, and trace element analysis; and methods for producing inner shell excitation of atoms in a sample of interest. The final chapter deals with applications of X-ray analysis. Content: Butterworths Monographs in Materials , Page ii Front Matter , Page iii Copyright , Page iv Chapter 1 - X-Ray Emission , Pages 1-9 Chapter 2 - Wavelength Dispersive Spectrometers , Pages 10-16 Chapter 3 - Energy Dispersive Spectrometers , Pages 17-41 Chapter 4 - Electron Penetration in Solids , Pages 42-56 Chapter 5 - Monte-Carlo Modelling , Pages 57-68 Chapter 6 - X-Ray Absorption , Pages 69-80 Chapter 7 - Secondary Fluorescence , Pages 81-90 Chapter 8 - Applying the Corrections (Quantitative Analysis) , Pages 91-99 Chapter 9 - Standards: Real, Complex and Imaginary , Pages 100-116 Chapter 10 - Accuracy and Errors , Pages 117-129 Chapter 11 - Spectrum Processing , Pages 130-150 Chapter 12 - Background in Electron Excited Spectra , Pages 151-163 Chapter 13 - Thin Sections in STEM and TEM , Pages 164-173 Chapter 14 - Ultra - Low Energies , Pages 174-180 Chapter 15 - X-ray Distribution Maps , Pages 181-191 Chapter 16 - Heterogeneous Samples , Pages 192-199 Chapter 17 - Less Common Methods , Pages 200-207 Chapter 18 - X-ray Fluorescence - Fundamentals , Pages 208-219 Chapter 19 - Regression Models , Pages 220-228 Chapter 20 - Hardware for XRF , Pages 229-236 Chapter 21 - Sample Effects , Pages 237-246 Chapter 22 - Scattering, Background and Trace Element Analysis , Pages 247-258 Chapter 23 - Modifying the Excitation Function , Pages 259-274 Chapter 24 - Other Ways to Excite the Sample , Pages 275-280 Chapter 25 - Sorting, Tagging, and Matching , Pages 281-290 Chapter 26 - Conclusions , Pages 291-294 References , Pages 295-304 Index , Pages 305-308 John C. Russ. Includes Index. Bibliography: P. 295-304.