Electron Microscopy XIV: Selected, Peer Reviewed Papers from the XIV International Conference on Electron Microscopy Em2011, June 26-30, 2011, Wisla, Poland (Solid State Phenomena)

These are the proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisła, Poland from the 26 to 30th June 2011. The goal of the conference was to provide a forum where researchers from many different countries could exchange their latest advances in the field of structural studies, regarding the use of electron microscopic techniques as applied to various materials. Plenary and invited lectures offered overviews of exciting new developments which highlighted the applications of new electron microscopic techniques in physics, chemistry, materials science and in life and earth sciences. Volume is indexed by Thomson Reuters CPCI-S (WoS).The papers cover topics such as electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques - as well as their application to materials science and related disciplines. Researchers from different countries exchange recent experiences in structural studies that use electron microscopy techniques on many different materials. Among 77 papers are discussions of the art and application of large angle convergent beam electron diffraction, near grain boundary behavior of aluminum bicrystals deformed in plane strain conditions, the structure and morphology of thin films deposited by pulsed laser deposition techniques, the positive hydrogen effect in structure surface layers on titanium alloys, and microstructural changes induced during the hydrogen charging process in stainless steels with and without nitrided layers This volume forms the Proceedings of the XIV International Conference on Electron Microscopy (EM2011) held in Wisła, Poland from 26 to 30 June 2011. The goal of the Conference was to provide a forum where researchers from different countries could exchange their last achievements in the field of structural studies with the use of electron microscopy techniques applied to many different materials. Plenary and invited lectures gave overviews on exciting new developments highlighting the application of the new electron microscopy techniques in physics, chemistry, materials science, life and earth science. Above 160 delegates from all over the world (Austria, Belgium, Czech Republic, Denmark, France, Germany, Great Britain, Hungary, Japan, Holland, Slovakia, Spain, Ukraine and USA) participated in the EM2011. During the conference 13 oral sessions took place and 49 presentations were given basically on electron, holography, tomography, HREM, STEM, EBSD, ED and precession techniques as well as their application in material sciences and other related disciplines. After the reviewing process 77 were accepted for publication in this issue of the Solid State Phenomena. temporary description, more details to follow Selected, peer reviewed papers from the XIV International Conference on Electron Microscopy (EM 2011), June 26-30, 2011, Wisla, Poland