Electron Microscopy and Analysis, Third Edition

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook. 1 Microscopy With Light And Electrons 1 -- 1.2 Methods Of Image Formation 2 -- 1.3 Pixels 3 -- 1.4 Light-optical Microscope 4 -- 1.5 Magnification 7 -- 1.6 Resolution 8 -- 1.7 Depth Of Field And Depth Of Focus 12 -- 1.8 Aberrations In Optical Systems 14 -- 1.9 Electrons Versus Light 16 -- 2 Electrons And Their Interaction With The Specimen 20 -- 2.2 Electrons 20 -- 2.3 Generating A Beam Of Electrons 24 -- 2.4 Deflection Of Electrons--magnetic Lenses 27 -- 2.5 Scattering Of Electrons By Atoms 29 -- 2.6 Elastic Scattering 30 -- 2.7 Inelastic Scattering 31 -- 2.8 Secondary Effects 34 -- 2.9 Family Of Electron Microscopes 37 -- 3 Electron Diffraction 40 -- 3.1 Geometry Of Electron Diffraction 41 -- 3.2 Diffraction Spot Patterns 47 -- 3.3 Use Of The Reciprocal Lattice In Diffraction Analysis 51 -- 3.4 Other Types Of Diffraction Pattern 58 -- 4 Transmission Electron Microscope 66 -- 4.1 Instrument 66 -- 4.2 Contrast Mechanisms 76 -- 4.3 High Voltage Electron Microscopy (hvem) 108 -- 4.4 Scanning Transmission Electron Microscopy (stem) 110 -- 4.5 Preparation Of Specimens For Tem 110 -- 5 Scanning Electron Microscope 122 -- 5.1 How It Works 122 -- 5.2 Obtaining A Signal In The Sem 124 -- 5.3 Optics Of The Sem 131 -- 5.4 Performance Of The Sem 133 -- 5.5 Ultimate Resolution Of The Sem 135 -- 5.6 Topographic Images 141 -- 5.7 Compositional Images 146 -- 5.8 Crystallographic Information From The Sem 149 -- 5.9 Use Of Other Signals In The Sem 153 -- 5.10 Image Acquisition, Processing And Storage 159 -- 5.11 Preparation Of Specimens For Examination In The Sem 162 -- 5.12 Low Voltage Microscopy 164 -- 5.13 Environmental Scanning Electron Microscopy (esem) 166 -- 6 Chemical Analysis In The Electron Microscope 169 -- 6.1 Generation Of X-rays Within A Specimen 170 -- 6.2 Detection And Counting Of X-rays 174 -- 6.3 X-ray Analysis Of Bulk Specimens 184 -- 6.4 X-ray Analysis Of Thin Specimens In The Tem 193 -- 6.5 Quantitative Analysis In An Electron Microscope 196 -- 6.6 Electron Energy Loss Spectroscopy (eels) 205 -- 6.7 A Brief Comparison Of Techniques 212 -- 7 Electron Microscopy And Other Techniques 214 -- 7.1 Complementary Imaging Techniques 214 -- 7.2 Complementary Analysis Techniques--alternative Analysis Systems 225 -- 7.3 Complementary Diffraction Techniques 233. Peter J. Goodhew, John Humphreys, Richard Beanland. Includes Bibliographical References (p. [236]-237) And Index. A microscope is an optical system which transforms an 'object' into an 'image'.