Dependable Embedded Systems

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly within the last five years. This book introduces the most prominent reliability concerns from today’s points of view and roughly recapitulates the progress in the community so far. Unlike other books that focus on a single abstraction level such circuit level or system level alone, the focus of this book is to deal with the different reliability challenges across different levels starting from the physical level all the way to the system level (cross-layer approaches). The book aims at demonstrating how new hardware/software co-design solution can be proposed to ef-fectively mitigate reliability degradation such as transistor aging, processor variation, temperature effects, soft errors, etc. * Provides readers with latest insights into novel, cross-layer methods and models with respect to dependability of embedded systems; * Describes cross-layer approaches that can leverage reliability through techniques that are pro-actively designed with respect to techniques at other layers; * Explains run-time adaptation and concepts/means of self-organization, in order to achieve error resiliency in complex, future many core systems. Front Matter ....Pages i-xiii RAP Model—Enabling Cross-Layer Analysis and Optimization for System-on-Chip Resilience (Andreas Herkersdorf, Michael Engel, Michael Glaß, Jörg Henkel, Veit B. Kleeberger, Johannes M. Kühn et al.)....Pages 1-27 Front Matter ....Pages 29-31 Soft Error Handling for Embedded Systems using Compiler-OS Interaction (Michael Engel, Peter Marwedel)....Pages 33-55 ASTEROID and the Replica-Aware Co-scheduling for Mixed-Criticality (Eberle A. Rambo, Rolf Ernst)....Pages 57-84 Dependability Aspects in Configurable Embedded Operating Systems (Horst Schirmeier, Christoph Borchert, Martin Hoffmann, Christian Dietrich, Arthur Martens, Rüdiger Kapitza et al.)....Pages 85-116 Front Matter ....Pages 117-119 Increasing Reliability Using Adaptive Cross-Layer Techniques in DRPs: Just-Safe-Enough Responses to Reliability Threats (Johannes Maximilian Kühn, Oliver Bringmann, Wolfgang Rosenstiel)....Pages 121-138 Dependable Software Generation and Execution on Embedded Systems (Florian Kriebel, Kuan-Hsun Chen, Semeen Rehman, Jörg Henkel, Jian-Jia Chen, Muhammad Shafique)....Pages 139-160 Fault-Tolerant Computing with Heterogeneous Hardening Modes (Florian Kriebel, Faiq Khalid, Bharath Srinivas Prabakaran, Semeen Rehman, Muhammad Shafique)....Pages 161-180 Thermal Management and Communication Virtualization for Reliability Optimization in MPSoCs (Victor M. van Santen, Hussam Amrouch, Thomas Wild, Jörg Henkel, Andreas Herkersdorf)....Pages 181-205 Lightweight Software-Defined Error Correction for Memories (Irina Alam, Lara Dolecek, Puneet Gupta)....Pages 207-232 Resource Management for Improving Overall Reliability of Multi-Processor Systems-on-Chip (Yue Ma, Junlong Zhou, Thidapat Chantem, Robert P. Dick, X. Sharon Hu)....Pages 233-246 Front Matter ....Pages 247-248 Cross-Layer Resilience Against Soft Errors: Key Insights (Daniel Mueller-Gritschneder, Eric Cheng, Uzair Sharif, Veit Kleeberger, Pradip Bose, Subhasish Mitra et al.)....Pages 249-275 Online Test Strategies and Optimizations for Reliable Reconfigurable Architectures (Lars Bauer, Hongyan Zhang, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, Jörg Henkel)....Pages 277-302 Reliability Analysis and Mitigation of Near-Threshold Voltage (NTC) Caches (Anteneh Gebregiorgis, Rajendra Bishnoi, Mehdi B. Tahoori)....Pages 303-334 Front Matter ....Pages 335-336 Selective Flip-Flop Optimization for Circuit Reliability (Mohammad Saber Golanbari, Mojtaba Ebrahimi, Saman Kiamehr, Mehdi B. Tahoori)....Pages 337-364 EM Lifetime Constrained Optimization for Multi-Segment Power Grid Networks (Han Zhou, Zeyu Sun, Sheriff Sadiqbatcha, Sheldon X.-D. Tan)....Pages 365-383 Monitor Circuits for Cross-Layer Resiliency (Mahfuzul Islam, Hidetoshi Onodera)....Pages 385-407 Dealing with Aging and Yield in Scaled Technologies (Wei Ye, Mohamed Baker Alawieh, Che-Lun Hsu, Yibo Lin, David Z. Pan)....Pages 409-429 Front Matter ....Pages 431-433 Design of Efficient, Dependable SoCs Based on a Cross-Layer-Reliability Approach with Emphasis on Wireless Communication as Application and DRAM Memories (Christian Weis, Christina Gimmler-Dumont, Matthias Jung, Norbert Wehn)....Pages 435-455 Uncertainty-Aware Compositional System-Level Reliability Analysis (Hananeh Aliee, Michael Glaß, Faramarz Khosravi, Jürgen Teich)....Pages 457-477 Robust Computing for Machine Learning-Based Systems (Muhammad Abdullah Hanif, Faiq Khalid, Rachmad Vidya Wicaksana Putra, Mohammad Taghi Teimoori, Florian Kriebel, Jeff (Jun) Zhang et al.)....Pages 479-503 Exploiting Memory Resilience for Emerging Technologies: An Energy-Aware Resilience Exemplar for STT-RAM Memories (Amir Mahdi Hosseini Monazzah, Amir M. Rahmani, Antonio Miele, Nikil Dutt)....Pages 505-526 Hardware/Software Codesign for Energy Efficiency and Robustness: From Error-Tolerant Computing to Approximate Computing (Abbas Rahimi, Rajesh K. Gupta)....Pages 527-543 Reliable CPS Design for Unreliable Hardware Platforms (Wanli Chang, Swaminathan Narayanaswamy, Alma Pröbstl, Samarjit Chakraborty)....Pages 545-563 Power-Aware Fault-Tolerance for Embedded Systems (Mohammad Salehi, Florian Kriebel, Semeen Rehman, Muhammad Shafique)....Pages 565-588 Our Perspectives (Jian-Jia Chen, Joerg Henkel)....Pages 589-592 Back Matter ....Pages 593-608