توموگرافی پروب اتمی: نظریه را به عمل تبدیل کنید

__Atom Probe Tomography__ is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms. For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process. * Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials * Written for both experienced researchers and new users * Includes exercises, along with corrections, for users to practice the techniques discussed * Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.

For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen—one of the leading scientific research centers exploring the various aspects of the instrument—will further enhance understanding and the learning process.

• Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
• Written for both experienced researchers and new users
• Includes exercises, along with corrections, for users to practice the techniques discussed
• Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy

Content: Front Matter,Copyright,Contributors,Preface,List of AbbreviationsEntitled to full textChapter One - Early Developments and Basic Concepts, Pages 1-15, D. Blavette, X. Sauvage Chapter Two - Field Ion Emission Mechanisms, Pages 17-72, F. Vurpillot Chapter Three - Basics of Field Ion Microscopy, Pages 73-95, F. Danoix, F. Vurpillot Chapter Four - Atom Probe Sample Preparation, Pages 97-121, I. Blum, F. Cuvilly, W. Lefebvre-Ulrikson Chapter Five - Time-of-Flight Mass Spectrometry and Composition Measurements, Pages 123-154, C. Pareige, W. Lefebvre-Ulrikson, F. Vurpillot, X. Sauvage Chapter Six - Atom Probe Tomography: Detector Issues and Technology, Pages 155-181, G. Da Costa Chapter Seven - Three-Dimensional Reconstruction in Atom Probe Tomography: Basics and Advanced Approaches, Pages 183-249, F. Vurpillot Chapter Eight - Laser-Assisted Field Evaporation, Pages 251-278, A. Vella, J. Houard Chapter Nine - Data Mining, Pages 279-317, W. Lefebvre-Ulrikson, G. Da Costa, L. Rigutti, I. Blum Chapter Ten - Correlative Microscopy by (Scanning) Transmission Electron Microscopy and Atom Probe Tomography, Pages 319-351, W. Lefebvre-Ulrikson Chapter Eleven - Combining Atom Probe Tomography and Optical Spectroscopy, Pages 353-375, L. Rigutti Appendix A, Pages 377-385 Appendix B, Pages 387-390 Index, Pages 391-402