Advances in x-ray analysis. Volume 9 : proceedings of the fourteenth Annual Conference on Applications of X-Ray Analysis held August 25-27, 1965

The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com­ bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor­ escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica­ tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference. Front Matter....Pages i-ix A Camera for Borrmann Stereo X-Ray Topographs....Pages 1-13 A Modification of the Scanning X-Ray Topographic Camera (Lang’s Method)....Pages 14-22 Lattice Defect Research by Kossel Technique and Deformation Analysis....Pages 23-34 The Crystalline Perfection of Melt-Grown GaAs Substrates and Ga(As, P) Epitaxial Deposits....Pages 35-50 The Application of Cylindrical Geometry for the Determination of Crystal Orientation....Pages 51-58 Observations of G-P Zone Reversion in Al-Zn-Mg Alloys by Small-Angle X-Ray Scattering and Transmission Electron Microscopy....Pages 59-73 Substructure Measurements by Statistical Fluctuations in X-Ray Diffraction Intensity....Pages 74-90 Analysis of the Broadening of Powder Pattern Peaks Using Variance, Integral Breadth, and Fourier Coefficients of the Line Profile....Pages 91-102 Lattice Strain Measurements on Deformed Fcc Metals....Pages 103-114 X-Ray Study of Wire-Drawn Niobium and Tantalum....Pages 115-130 The Structure of the γ’-Phase in Nickel-Base Superalloys....Pages 131-141 Generation of a Two-Dimensional Silicon Carbide Lattice....Pages 142-151 An X-Ray Diffraction Study of the Phase Transformation Temperature of MnO....Pages 152-158 Crystallographic Studies of NH 4 Cl-NH 4 Br Solid Solutions....Pages 159-169 Rotational Polymorphism of Methyl-Substituted Ammonium Perchlorates....Pages 170-189 Oriented Crystallization of Urea in Membranes....Pages 190-193 High-Intensity Rotating Anode X-Ray Tubes....Pages 194-201 A Dual Counter X-Ray Analyzer for the Rapid Quantitative Analysis of Two-Phase Systems....Pages 202-207 Correction for Non-Linearity of Proportional Counter Systems in Electron Probe X-Ray Microanalysis....Pages 208-220 A Combined Focusing X-Ray Diffractometer and Nondispersive X-Ray Spectrometer for Lunar and Planetary Analysis....Pages 221-241 Two-Crystal X-Ray Spectrometer Attachment....Pages 242-250 Plane-Polarized, Two-Crystal X-ray Spectrometer....Pages 251-258 Evaluation of Quantitative Electron Microprobe Analyses of Multiphase Microcrystalline Refractory Materials....Pages 259-264 A Method for Trace Analysis with an Electron Microprobe....Pages 265-272 The Application of the Ziebold Correction Procedure for Probe Data to Three Ternary Copper-Base Alloys....Pages 273-288 Homogeneity Characterization of NBS Spectrometric Standards II: Cartridge Brass and Low-Alloy Steel....Pages 289-303 Electron Probe Microanalysis of Zincbearing Hexagonal Ferrites....Pages 304-313 Electron Microprobe Analysis of Highly Radioactive Samples....Pages 314-322 The Effect of Chemical Combination on the K X-ray Spectra of Silicon....Pages 323-328 The Effect of Chemical Combination on Some Soft X-ray K and L Emission Spectra....Pages 329-343 L and M X-Ray Spectra in the Region 2–85 Å....Pages 344-353 Chemical Bonding and the Sulfur K X-Ray Spectrum....Pages 354-364 Determination of Electron Distribution and Bonding from Soft X-Ray Emission Spectroscopy....Pages 365-375 Chemical Effect on X-Ray Absorption-Edge Fine Structure....Pages 376-392 The Effect of Chemical Combination on X-Ray Spectra: Open Discussion....Pages 393-397 Determination of Interatomic Distances from X-Ray Absorption Fine Structure....Pages 398-409 X-Ray Techniques in the 1 to 400 Å Range....Pages 410-419 A Blazed-Grating Scanning Spectrometer for Ultrasoft X-Rays Suitable for Use in an Electron Microprobe....Pages 420-429 Application of Multilayer Analyzers to 15–150 Å Fluorescence Spectroscopy for Chemical and Valence Band Analysis....Pages 430-440 Matrix and Particle Size Effects in Analyses of Light Elements, Zinc through Oxygen, by Soft X-Ray Spectrometry....Pages 441-455 The Characteristic X-Rays from Boron and Beryllium....Pages 456-470 The Application of a Soft X-Ray Spectrometer to Study the Oxygen and Fluorine Emission Lines from Oxides and Fluorides....Pages 471-486 Use of the Soft X-Ray Spectrograph and the Electron-Probe Microanalyzer for Determination of Elements Carbon through Iron in Minerals and Rocks....Pages 487-503 A “Windowless” X-Ray Fluorescence Tube and a High-Resolution Diffractometer....Pages 504-507 On the Primary X-Ray Analyzer....Pages 508-514 Some Observations on the Use of Certain Analyzing Crystals for the Determination of Silicon and Aluminum....Pages 515-527 X-Ray Spectrographic Analysis of Automotive Combustion Deposits Without the Use of Calibration Curves....Pages 528-532 Back Matter....Pages 533-544 The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical comƯ bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluorƯ escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S.P. Ong on the uses and applicaƯ tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry.