Advances in Imaging and Electron Physics, Volume 146 (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics) (Advances in Imaging and Electron Physics)

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Content: Contents Pages v-vi Contributors Page vii Preface Page ix Peter W. Hawkes Future Contributions Pages xi-xvi Spiral Phase Microscopy Review Article Pages 1-56 Severin Fürhapter, Alexander Jesacher, Christian Maurer, Stefan Bernet, Monika Ritsch-Marte LULU Theory, Idempotent Stack Filters, and the Mathematics of Vision of Marr Review Article Pages 57-162 Carl H. Rohwer, Marcel Wild Bayesian Information Geometry: Application to Prior Selection on Statistical Manifolds Review Article Pages 163-207 Hichem Snoussi Index Pages 209-217 Merges two serials - "Advances in Electronics and Electron Physics" and "Advances in Optical and Electron Microscopy". This series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, and image science and digital image processing.