Accelerated testing : statistical models, test plans, and data analyses

Accelerated Testing Statistical Models, Test Plans, and Data Analyses; Contents; Preface; 1. Introduction and Background; 2. Models for Life Tests with Constant Stress; 3. Graphical Data Analysis; 4. Complete Data and Least Squares Analyses; 5. Censored Data and Maximum Ukelihood Methods; 6. Test Plans; 7. Competing Failure Modes and Size Effect; 8. Least-Squares Comparisons for Complete Data; 9. Maximum Likelihood Comparisons for Censored and Other Data; 10. Models and Data Analyses for Step and Varying Stress; 11. Accelerated Degradation; Appendix A. Statistical Tables; References; Index Accelerated Testing Statistical Models, Test Plans, and Data Analyses......Page 1 Contents......Page 9 Preface......Page 13 1. Introduction and Background......Page 17 1. Survey of Methodology and Applications......Page 19 2. Types of Data......Page 28 3. Types of Acceleration and Stress Loading......Page 31 4. Engineering Considerations......Page 38 5. Common Accelerated Tests......Page 53 6. Statistical Considerations......Page 59 Problems......Page 65 1. Introduction......Page 67 2. Basic Concepts and the Exponential Distribution......Page 69 3. Normal Distribution......Page 74 4. Lognormal Distribution......Page 76 5. Weibull Distribution......Page 79 6. Extreme Value Distribution......Page 81 7. Other Distributions......Page 84 8. Life-Stress Relationships......Page 87 9. Arrhenius Life-Temperature Relationship......Page 91 10. Inverse Power Relationship......Page 101 11. Endurance (Fatigue) Limit Relationships and Distributions......Page 108 12. Other Single Stress Relationships......Page 111 13. Multivariable Relationships......Page 114 14. Spread in Log Life Depends on Stress......Page 121 Problems......Page 123 1. Introduction......Page 129 2. Complete Data and Arrhenius-Lognormal Model......Page 130 3. Complete Data and Power-Weibull Model......Page 144 4. Singly Censored Data......Page 150 5. Multiply Censored Data......Page 155 6. Interval (Read-out) Data......Page 161 Problems......Page 170 1. Introduction......Page 183 2. Least-Squares Methods for Lognormal Life......Page 186 3. Checks on the Linear-Lognormal Model and Data......Page 198 4. Least-Squares Methods for Weibull and Exponential Life......Page 205 5. Checks on the Linear-Weibull Model and Data......Page 219 6. Multivariable Relationships......Page 226 Problems......Page 245 5. Censored Data and Maximum Ukelihood Methods......Page 249 1. Introduction to Maximum Likelihood......Page 250 2. Fit the Simple Model to Right Censored Data......Page 258 3. Assess the Simple Model and Right Censored Data......Page 271 4. Other Models and Types of Data......Page 281 5. Maximum Likelihood Calculations......Page 300 Problems......Page 318 1. Plans for the Simple Model and Complete Data......Page 333 2. Plans for the Simple Model and Singly Censored Data......Page 344 3. Evaluation of a Test Plan by Simulation......Page 365 4. Survey of Test Plans......Page 377 5. ML Theory for Test Plans......Page 380 Problems......Page 387 7. Competing Failure Modes and Size Effect......Page 393 1. Series-System Model......Page 394 2. Series Systems of Identical Parts......Page 399 3. Size Effect......Page 401 4. Nonuniform Stress......Page 403 5. Graphical Analysis......Page 408 6. ML Analysis for Competing Failure Modes......Page 423 7. ML Theory for Competing Modes......Page 429 Problems......Page 433 8. Least-Squares Comparisons for Complete Data......Page 441 1. Hypothesis Tests and Confidence Intervals......Page 442 2. Graphical Comparisons......Page 445 3. Compare Log Standard Deviations......Page 450 4. Compare (Log) Means......Page 453 5. Compare Simple Relationships......Page 457 6. Compare Multivariable Relationships......Page 461 Problems......Page 464 1. Introduction......Page 467 2. One-Sample Comparisons......Page 468 3. Two-Sample Comparisons......Page 474 4. K-Sample Comparisons......Page 481 5. Theory for LR and Related Tests......Page 486 Problems......Page 504 10. Models and Data Analyses for Step and Varying Stress......Page 509 1. Survey of Theory for Tests with Varying Stress......Page 510 2. Step-Stress Model and Data Analyses......Page 511 3. Varying-Stress Model and Data Analyses......Page 522 Problems......Page 529 1. Survey of Applications......Page 537 2. Degradation Models......Page 539 3. Arrhenius Analysis......Page 550 Problems......Page 560 Appendix A. Statistical Tables......Page 565 A1. Standard Normal Cumulative Distribution Function Φ(u)......Page 566 A3. Standard Normal Two-Sided Factors Kp......Page 568 A4. t-Distribution Percentiles t(P;v)......Page 569 A5. Chi-Square Percentiles X2(P;v)......Page 570 A6a. F-Distribution 95% Points F(0.95;v1,v2)......Page 572 A6b. F-Distribution 99% Points F(0.99;v1,v2)......Page 574 A7. Probability Plotting Positions Fi = 10O(i–0.5)/n......Page 576 References......Page 577 Index......Page 595 The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ". . . a goldmine of knowledge on accelerated life testing principles and practices ... one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering."--Dev G. Raheja, Quality and Reliability Engineering International ". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently."--Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source. The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ". . . a goldmine of knowledge on accelerated life testing principles and practices ... one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." Dev G. Raheja, Quality and Reliability Engineering International ". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source

The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists.

"... a goldmine of knowledge on accelerated life testing principles and practices... one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering."
–Dev G. Raheja, Quality and Reliability Engineering International

"... an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently."
–Journal of the Royal Statistical Society

A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.